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Decay Method for Measuring Complex Dielectric Constants During Microwave ProcessingWe have developed a fast in-situ method for measuring the quality factor, Q, and resonant frequency, fr, for an isolated microwave resonant mode. The mode resonant frequency was continuously monitored using a phase modulation frequency tracking technique.
Document ID
20060038337
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Iny, O.
Barmatz, M.
Date Acquired
August 23, 2013
Publication Date
April 1, 1994
Distribution Limits
Public
Copyright
Other
Keywords
microwave resonant frequency decay curve exponential

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