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Low Temperature Reliability of FD-SOI Transistors Abstract #: IRPS_DP118Fully-depleted silicon on insulator transitors were characterized at low temperatures for performance reliability.
Document ID
20060040933
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/18405
Authors
Yuan, J.
Patel, J.
Kayali, S.
Date Acquired
August 23, 2013
Publication Date
April 10, 2000
Distribution Limits
Public
Copyright
Other
Keywords
IRPS_DP118 FD-SOI Transistors Low Temperature SOI electronic systems

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