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Compendium of Single Event Failures in Power MOSFETsThis compendium of SEGR and SEB data organizes results from several laboratories comparing failure thresholds for several different manufacturers and technologies. The results of this compendium are aimed at the designer to show the possible variations between manufacturers and processes.
Document ID
20060041420
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/20299
Authors
Coss, J. R.
Swift, G. M.
Selva, L. E.
Titus, J. L.
Normand, E.
Oberg, D. L.
Date Acquired
August 23, 2013
Publication Date
July 20, 1998
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
Single Event Failures MOSFETs SEGR SEB

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