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Single-event upset in power-PC processors
Document ID
20060042515
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/37187
Authors
Irom, F.
Johnston, A. H.
Swift, G. M.
Date Acquired
August 23, 2013
Publication Date
September 19, 2002
Distribution Limits
Public
Copyright
Other
Keywords
processor testing single event upset

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