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Single-event upsets in highly scaled commercial SOI microprocessor
Document ID
20060043558
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38452
Authors
Irom, Farokh
Farmanesh, Farhad
Date Acquired
August 23, 2013
Publication Date
April 27, 2004
Meeting Information
Meeting: Single Event Effects Symposium
Location: Manhattan Beach, CA
Country: United States
Start Date: April 27, 2004
End Date: April 29, 2004
Distribution Limits
Public
Copyright
Other
Keywords
power pc
Silicon on insulators

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