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Floating gate dosimetry based on differential charge injection
Document ID
20060044255
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/39442
Authors
Scheick, Leif Z.
McNulty, P. J.
Date Acquired
August 23, 2013
Publication Date
July 16, 2001
Subject Category
Space Radiation
Meeting Information
Meeting: Nuclear and Space Radiation Effects (NSREC) Conference
Location: Vancouver, British Columbia
Country: Canada
Start Date: July 16, 2001
Distribution Limits
Public
Copyright
Other
Keywords
Floating gate Avalanche Metal Oxide Semiconductor (FAMOS)
Microdosimetry
Floating Gate
Dosimetry

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