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Catastrophic SEE in high-voltage power MOSFETsHeavy ion irradiation of high-voltage power MOSFETs with long-range ions was performed using 14, 19, 22, 24, 28 and 39 MeV-cm2/mg ions.
Document ID
20060046292
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38199
Authors
Selva, L. E.
Scheick, L. Z.
McClure, S.
Swift, G. M.
Miyahira, T.
Guertin, S. M.
Shah, S. K.
Edmonds, L. D.
Patterson, J. D.
Date Acquired
August 23, 2013
Publication Date
July 1, 2003
Subject Category
Space Radiation
Meeting Information
Meeting: IEEE Nuclear and Space Radiation Effects (NSREC) Conference
Location: Monterey, CA
Country: United States
Start Date: July 21, 2003
Distribution Limits
Public
Copyright
Other
Keywords
MOSFET
high-voltage

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