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SIM astrometric demonstration at the 150 picometer level using the MAM testbed
Document ID
20060046317
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/38972
Authors
Goullioud, Renaud
Akopyan, Shake
An, Xin
Azevedo, Steve
Bell, Charlie
Bloemhof, Eric
Catanzarite, Joe
Cox, Brian
Deck, Mike
Dew, Sharon
Eychaner, Glenn
Gursel, Yekta
Hines, Brad
Holmes, Buck
Irigoyen, Bob
Irwin, Phil
Kruid, Ron
Lapiez, Dennis
Neat, Greg
Pan, Xiaopei
Park, Sung
Regehr, Martin
Savedra, Raymond
Shao, Mike
Shaw, John
Date Acquired
August 23, 2013
Publication Date
August 15, 2003
Meeting Information
Meeting: IEEE Aerospace Conference
Location: Big Sky, MT
Country: United States
Start Date: August 15, 2003
Distribution Limits
Public
Copyright
Other
Keywords
interferometry
SIM
metrology
picometers
astrometry

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