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Calibration Issues and Operating System Requirements for Electron-Probe MicroanalysisInstrument purchase requirements and dialogue with manufacturers have established hardware parameters for alignment, stability, and reproducibility, which have helped improve the precision and accuracy of electron microprobe analysis (EPMA). The development of correction algorithms and the accurate solution to quantitative analysis problems requires the minimization of systematic errors and relies on internally consistent data sets. Improved hardware and computer systems have resulted in better automation of vacuum systems, stage and wavelength-dispersive spectrometer (WDS) mechanisms, and x-ray detector systems which have improved instrument stability and precision. Improved software now allows extended automated runs involving diverse setups and better integrates digital imaging and quantitative analysis. However, instrumental performance is not regularly maintained, as WDS are aligned and calibrated during installation but few laboratories appear to check and maintain this calibration. In particular, detector deadtime (DT) data is typically assumed rather than measured, due primarily to the difficulty and inconvenience of the measurement process. This is a source of fundamental systematic error in many microprobe laboratories and is unknown to the analyst, as the magnitude of DT correction is not listed in output by microprobe operating systems. The analyst must remain vigilant to deviations in instrumental alignment and calibration, and microprobe system software must conveniently verify the necessary parameters. Microanalysis of mission critical materials requires an ongoing demonstration of instrumental calibration. Possible approaches to improvements in instrument calibration, quality control, and accuracy will be discussed. Development of a set of core requirements based on discussions with users, researchers, and manufacturers can yield documents that improve and unify the methods by which instruments can be calibrated. These results can be used to continue improvements of EPMA.
Document ID
20060047577
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Carpenter, P.
(BAE Systems Huntsville, AL, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2006
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Microscopy and Microanalysis 2006 Meeting
Location: Chicago, IL
Country: United States
Start Date: July 30, 2006
End Date: August 3, 2006
Funding Number(s)
CONTRACT_GRANT: NAS8-02096
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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