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Thin Film Physical Sensor Instrumentation Research and Development at NASA Glenn Research CenterA range of thin film sensor technology has been demonstrated enabling measurement of multiple parameters either individually or in sensor arrays including temperature, strain, heat flux, and flow. Multiple techniques exist for refractory thin film fabrication, fabrication and integration on complex surfaces and multilayered thin film insulation. Leveraging expertise in thin films and high temperature materials, investigations for the applications of thin film ceramic sensors has begun. The current challenges of instrumentation technology are to further develop systems packaging and component testing of specialized sensors, further develop instrumentation techniques on complex surfaces, improve sensor durability, and to address needs for extreme temperature applications. The technology research and development ongoing at NASA Glenn for applications to future launch vehicles, space vehicles, and ground systems is outlined.
Document ID
20060049130
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Wrbanek, John D.
(NASA Glenn Research Center Cleveland, OH, United States)
Fralick, Gustave C.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
September 7, 2013
Publication Date
September 1, 2006
Subject Category
Instrumentation And Photography
Report/Patent Number
E-15674
NASA/TM-2006-214395
Meeting Information
Meeting: 52nd International Instrumentation Symposium
Location: Cleveland, OH
Country: United States
Start Date: May 7, 2006
End Date: May 11, 2006
Sponsors: ISA Aerospace, Propulsion Instrumentation Working Group
Funding Number(s)
WBS: WBS 561581.02.01.03.08
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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