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Measurement Challenges for Carbon Nanotube MaterialThe advances in large scale applications of carbon nanotubes demand a reliable supply of raw and processed materials. It is imperative to have a consistent quality control of these nanomaterials to distinguish material inconsistency from the modifications induced by processing of nanotubes for any application. NASA Johnson Space Center realized this need five years back and started a program to standardize the characterization methods. The JSC team conducted two workshops (2003 and 2005) in collaboration with NIST focusing on purity and dispersion measurement issues of carbon nanotubes [1]. In 2004, the NASA-JSC protocol was developed by combining analytical techniques of SEM, TEM, UV-VIS-NIR absorption, Raman, and TGA [2]. This protocol is routinely used by several researchers across the world as a first step in characterizing raw and purified carbon nanotubes. A suggested practice guide consisting of detailed chapters on TGA, Raman, electron microscopy and NIR absorption is in the final stages and is undergoing revisions with input from the nanotube community [3]. The possible addition of other techniques such as XPS, and ICP to the existing protocol will be presented. Recent activities at ANSI and ISO towards implementing these protocols as nanotube characterization standards will be discussed.
Document ID
20070001007
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Sosa, Edward
(Engineering Research and Consulting, Inc. Houston, TX, United States)
Arepalli, Sivaram
(Engineering Research and Consulting, Inc. Houston, TX, United States)
Nikolaev, Pasha
(Engineering Research and Consulting, Inc. Houston, TX, United States)
Gorelik, Olga
(Engineering Research and Consulting, Inc. Houston, TX, United States)
Yowell, Leonard
(NASA Johnson Space Center Houston, TX, United States)
Date Acquired
August 24, 2013
Publication Date
January 1, 2006
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: NIST Workshop on Nanotechnology
Location: Gaithersburg, MD
Country: United States
Start Date: October 16, 2006
End Date: October 19, 2006
Distribution Limits
Public
Copyright
Public Use Permitted.
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