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SEU Performance of TAG Based Flip FlopsWe describe heavy ion test results for two new SEU tolerant latches based on transition nand gates, one for single rail asynchronous and the other for dual rail synchronous designs, implemented in AMI 0.5microprocess.
Document ID
20070019369
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Shuler, Robert L. (NASA Johnson Space Center Houston, TX, United States)
Kouba, Coy (NASA Johnson Space Center Houston, TX, United States)
O'Neill, Patrick M. (NASA Johnson Space Center Houston, TX, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2005
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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