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Texas Instruments-Digital Signal Processor(TI-DSP)SMJ320F20 SEL TestingThis viewgraph presentation reviews the testing of the Texas Instrument Digital Signal Processor(TI-DSP)SMJ320F20. Tests were performed to screen for susceptibility to Single Event Latchup (SEL) and measure sensitivity as a function of Linear Energy Transfer (LET) for an application specific test setup. The Heavy Ion Testing of two TI-DSP SMJ320F240 devices experienced Single Event Latchup (SEL) conditions at an LET of 1.8 MeV/(mg/square cm) The devices were exposed from a fluence of 1.76 x l0(exp 3) to 5.00 x 10(exp 6) particles/square cm of the Neon, Argon and Krypton ion beams. For DI(sub DD) an average latchup current occurred at about 700mA, which is a magnitude of 10 over the nominal current of 700mA.
Document ID
20070022328
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Sanders, Anthony B. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Poivey, C. (MEI Technologies, Inc. Seabrook, MD, United States)
Kim, H. S. (MEI Technologies, Inc. Seabrook, MD, United States)
Gee, George B. (MEI Technologies, Inc. Seabrook, MD, United States)
Date Acquired
August 23, 2013
Publication Date
September 28, 2006
Subject Category
Space Radiation
Meeting Information
Meeting: 9th Annual International MAPLD (Military and Aerospace Programmable Logic Devices) Conference
Location: Washington, DC
Country: United States
Start Date: September 26, 2006
End Date: September 28, 2006
Sponsors: NASA Goddard Space Flight Center
Distribution Limits
Public
Copyright
Public Use Permitted.

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