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Reliability Through Life of Internal Protection Devices in Small-Cell ABSL BatteriesThis viewgraph presentation reviews a reliability analysis of small cell protection batteries. The contents include: 1) The s-p Topology; 2) Cell Level Protection Devices; 3) Battery Level Fault Protection; 4) Large Cell Comparison; and 5) Battery Level Testing and Results.
Document ID
20070032991
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Neubauer, Jeremy (ABSL Space Products Abington, United Kingdom)
Ng, Ka Lok (ABSL Space Products Abington, United Kingdom)
Bennetti, Andrea (ABSL Space Products Abington, United Kingdom)
Pearson, Chris (ABSL Space Products Abington, United Kingdom)
Rao, gopal (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 23, 2013
Publication Date
April 26, 2007
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2007 Space Power Workshop
Location: Los Angeles, CA
Country: United States
Start Date: April 23, 2007
End Date: April 26, 2007
Distribution Limits
Public
Copyright
Public Use Permitted.

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