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Wiring Damage Analyses for STS OV-103This study investigated the Shuttle Program s belief that Space Transportation System (STS) wiring damage occurrences are random, that is, a constant occurrence rate. Using Problem Reporting and Corrective Action (PRACA)-derived data for STS Space Shuttle OV-103, wiring damage was observed to increase over the vehicle s life. Causal factors could include wiring physical deterioration, maintenance and inspection induced damage, and inspection process changes resulting in more damage events being reported. Induced damage effects cannot be resolved with existent data. Growth analysis (using Crow-AMSAA, or CA) resolved maintenance/inspection effects (e.g., heightened awareness) on all wire damages and indicated an overall increase since Challenger Return-to-Flight (RTF). An increasing failure or occurrence rate per flight cycle was seen for each wire damage mode; these (individual) rates were not affected by inspection process effects, within statistical error.
Document ID
20070035101
Acquisition Source
Goddard Space Flight Center
Document Type
Technical Publication (TP)
Authors
Thomas, Walter, III
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
May 1, 2006
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
2006-00678-1
NASA/TP-2006-214156
Report Number: 2006-00678-1
Report Number: NASA/TP-2006-214156
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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