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Directional spectral emissivity measurement systemApparatus and process for determining the emissivity of a test specimen including an integrated sphere having two concentric walls with a coolant circulating therebetween, and disposed within a chamber which may be under ambient, vacuum or inert gas conditions. A reference sample is disposed within the sphere with a monochromatic light source in optical alignment therewith. A pyrometer is in optical alignment with the test sample for obtaining continuous test sample temperature measurements during a test. An arcuate slit port is provided through the spaced concentric walls of the integrating sphere with a movable monochromatic light source extending through and movable along the arcuate slit port. A detector system extends through the integrating sphere for continuously detecting an integrated signal indicative of all radiation within its field of view, as a function of the emissivity of the test specimen at various temperatures and various angle position of the monochromatic light source. A furnace for heating the test sample to approximately 3000 K. and control mechanism for transferring the heated sample from the furnace to the test sample port in the integrating sphere is also contained within the chamber.
Document ID
20080004345
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Halyo, Nesim
Pandey, Dhirendra K.
Date Acquired
August 24, 2013
Publication Date
March 24, 1992
Subject Category
Optics
Report/Patent Number
Patent Number: US-PATENT-5,098,195
Patent Application Number: US-PATENT-APPL-SN-606164
Funding Number(s)
CONTRACT_GRANT: NAS1-16478
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,098,195
Patent Application
US-PATENT-APPL-SN-606164
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