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Advanced x-ray imaging spectrometerAn x-ray spectrometer that also provides images of an x-ray source. Coded aperture imaging techniques are used to provide high resolution images. Imaging position-sensitive x-ray sensors with good energy resolution are utilized to provide excellent spectroscopic performance. The system produces high resolution spectral images of the x-ray source which can be viewed in any one of a number of specific energy bands.
Document ID
20080004582
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Callas, John L.
Soli, George A.
Date Acquired
August 24, 2013
Publication Date
May 26, 1998
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-5,757,005
Patent Application Number: US-PATENT-APPL-SN-745572
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,757,005
Patent Application
US-PATENT-APPL-SN-745572
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