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Vision inspection system and methodAn optical vision inspection system (4) and method for multiplexed illuminating, viewing, analyzing and recording a range of characteristically different kinds of defects, depressions, and ridges in a selected material surface (7) with first and second alternating optical subsystems (20, 21) illuminating and sensing successive frames of the same material surface patch. To detect the different kinds of surface features including abrupt as well as gradual surface variations, correspondingly different kinds of lighting are applied in time-multiplexed fashion to the common surface area patches under observation.
Document ID
20080004621
Acquisition Source
Kennedy Space Center
Document Type
Other - Patent
Authors
Huber, Edward D.
Williams, Rick A.
Date Acquired
August 24, 2013
Publication Date
October 21, 1997
Subject Category
Optics
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-395847
Patent Number: US-PATENT-5,680,215
Funding Number(s)
CONTRACT_GRANT: NAS10-10900
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,680,215
Patent Application
US-PATENT-APPL-SN-395847

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