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EllipsometerIn an ellipsometer, a phase-modulated, polarized light beam is applied to a sample, electrical signals are obtained representing the orthogonal planes of polarization of the light after it has interacted with the sample and the constants of the sample are calculated from the two resulting electrical signals. The phase modulation is sufficiently small so that the calibration errors are negligible. For this purpose, the phase modulator, phase modulates the light within a range of no more than ten degrees peak to peak. The two electrical signals are expanded by Fourier analysis and the coefficients thereof utilized to calculate psi and delta.
Document ID
20080004630
Acquisition Source
Marshall Space Flight Center
Document Type
Other - Patent
Authors
Ducharme, Stephen Paul
El Hajj, Hassanayn Machlab
Johs, Blaine D.
Woollam, John A.
Date Acquired
August 24, 2013
Publication Date
August 12, 1997
Subject Category
Optics
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-440715
Patent Number: US-PATENT-5,657,126
Funding Number(s)
CONTRACT_GRANT: NAS8-39327
CONTRACT_GRANT: NAS8-39920
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,657,126
Patent Application
US-PATENT-APPL-SN-440715
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