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Rotating flux-focusing eddy current probe for flaw detectionA flux-focusing electromagnetic sensor which uses a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks about circular fasteners and other circular inhomogeneities in high conductivity material. The unique feature of the device is the ferrous shield isolating a high-turn pick-up coil from an excitation coil, The use of the magnetic shield is shown to produce a null voltage output across the receiving coil in the presence of an unflawed sample. A redistribution of the current flow in the sample caused by the presence of flaws, however, eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal. By rotating the probe in a path around a circular fastener such as a rivet while maintaining a constant distance between the probe and the center of a rivet, the signal due to current flow about the rivet can be held constant. Any further changes in the current distribution, such as due to a fatigue crack at the rivet joint, can be detected as an increase in the output voltage above that due to the flow about the rivet head.
Document ID
20080004633
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Wincheski, Russell A.
Fulton, James P.
Nath, Shridhar C.
Simpson, John W.
Namkung, Min
Date Acquired
August 24, 2013
Publication Date
July 15, 1997
Subject Category
Metals And Metallic Materials
Report/Patent Number
Patent Number: US-PATENT-5,648,721
Patent Application Number: US-PATENT-APPL-SN-343740
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,648,721
Patent Application
US-PATENT-APPL-SN-343740
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