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Method and apparatus for evaluating multilayer objects for imperfectionsA multilayer object having multiple layers arranged in a stacking direction is evaluated for imperfections such as voids, delaminations and microcracks. First, an acoustic wave is transmitted into the object in the stacking direction via an appropriate transducer/waveguide combination. The wave propagates through the multilayer object and is received by another transducer/waveguide combination preferably located on the same surface as the transmitting combination. The received acoustic wave is correlated with the presence or absence of imperfections by, e.g., generating pulse echo signals indicative of the received acoustic wave, wherein the successive signals form distinct groups over time. The respective peak amplitudes of each group are sampled and curve fit to an exponential curve, wherein a substantial fit of approximately 80-90% indicates an absence of imperfections and a significant deviation indicates the presence of imperfections. Alternatively, the time interval between distinct groups can be measured, wherein equal intervals indicate the absence of imperfections and unequal intervals indicate the presence of imperfections.
Document ID
20080004817
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Heyman, Joseph S.
Abedin, Nurul
Sun, Kuen J.
Date Acquired
August 24, 2013
Publication Date
June 10, 1997
Subject Category
Acoustics
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-571687
Patent Number: US-PATENT-5,637,799
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,637,799
Patent Application
US-PATENT-APPL-SN-571687
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