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Delta-doped CCD's as low-energy particle detectors and imagersThe back surface of a thinned charged-coupled device (CCD) is treated to eliminate the backside potential well that appears in a conventional thinned CCD during backside illumination. The backside of the CCD includes a delta layer of high-concentration dopant confined to less than one monolayer of the crystal semiconductor. The thinned, delta-doped CCD is used to detect very low-energy particles that penetrate less than 1.0 nm into the CCD, including electrons having energies less than 1000 eV and protons having energies less than 10 keV.
Document ID
20080004993
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Nikzad, Shouleh
Hoenk, Michael E.
Hecht, Michael H.
Date Acquired
August 24, 2013
Publication Date
June 11, 2002
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: US-PATENT-6,403,963
Patent Application Number: US-PATENT-APPL-SN-162918
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-6,403,963
Patent Application
US-PATENT-APPL-SN-162918
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