NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Methods for identification and verification using vacuum XRF systemApparatus and methods in which one or more elemental taggants that are intrinsically located in an object are detected by x-ray fluorescence analysis under vacuum conditions to identify or verify the object's elemental content for elements with lower atomic numbers. By using x-ray fluorescence analysis, the apparatus and methods of the invention are simple and easy to use, as well as provide detection by a non line-of-sight method to establish the origin of objects, as well as their point of manufacture, authenticity, verification, security, and the presence of impurities. The invention is extremely advantageous because it provides the capability to measure lower atomic number elements in the field with a portable instrument.
Document ID
20080005073
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Schramm, Fred
Kaiser, Bruce
Date Acquired
August 24, 2013
Publication Date
June 21, 2005
Subject Category
Chemistry And Materials (General)
Report/Patent Number
Patent Number: US-PATENT-6,909,770
Patent Application Number: US-PATENT-APPL-SN-307191
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-6,909,770
Patent Application
US-PATENT-APPL-SN-307191
No Preview Available