NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Cell buffer with built-in testA cell buffer with built-in testing mechanism is provided. The cell buffer provides the ability to measure voltage provided by a power cell. The testing mechanism provides the ability to test whether the cell buffer is functioning properly and thus providing an accurate voltage measurement. The testing mechanism includes a test signal-provider to provide a test signal to the cell buffer. During normal operation, the test signal is disabled and the cell buffer operates normally. During testing, the test signal is enabled and changes the output of the cell buffer in a defined way. The change in the cell buffer output can then be monitored to determine if the cell buffer is functioning correctly. Specifically, if the voltage output of the cell buffer changes in a way that corresponds to the provided test signal, then the functioning of the cell buffer is confirmed. If the voltage output of the cell buffer does not change correctly, then the cell buffer is known not to be operating correctly. Thus, the built in testing mechanism provides the ability to quickly and accurately determine if the cell buffer is operating correctly. Furthermore, the testing mechanism provides this functionality without requiring excessive device size and complexity.
Document ID
20080005175
Acquisition Source
Johnson Space Center
Document Type
Other - Patent
Authors
Ott, William E.
Date Acquired
August 24, 2013
Publication Date
August 17, 2004
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Number: US-PATENT-6,777,946
Patent Application Number: US-PATENT-APPL-SN-186517
Funding Number(s)
CONTRACT_GRANT: NAS9-20000
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-6,777,946
Patent Application
US-PATENT-APPL-SN-186517
No Preview Available