NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Systems and methods for measuring component matchingSystems and methods for measuring a contour match between adjacent components are disclosed. In one embodiment, at least two pressure sensors are located between adjacent components. Each pressure sensor is adapted to obtain a pressure measurement at a location a predetermined distance away from the other pressure sensors, and to output a pressure measurement for each sensor location. An output device is adapted to receive the pressure measurements from at least two pressure sensors and display the pressure measurements. In one aspect, the pressure sensors include flexible thin film pressure sensors. In accordance with other aspects of the invention, a method is provided for measuring a contour match between two interfacing components including measuring at least one pressure applied to at least one sensor between the interfacing components.
Document ID
20080008685
Acquisition Source
Johnson Space Center
Document Type
Other - Patent
Authors
Courter, Kelly J.
Slenk, Joel E.
Date Acquired
August 24, 2013
Publication Date
April 11, 2006
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-10/744,860
Patent Number: US-Patent-7,027,949
Funding Number(s)
CONTRACT_GRANT: NAS9-2000
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,027,949
Patent Application
US-Patent-Appl-SN-10/744,860
No Preview Available