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Sub-diffraction limit resolution in microscopyA method and apparatus for visualizing sub-micron size particles employs a polarizing microscope wherein a focused beam of polarized light is projected onto a target, and a portion of the illuminating light is blocked from reaching the specimen, whereby to produce a shadow region, and projecting diffracted light from the target onto the shadow region.
Document ID
20080009493
Acquisition Source
Marshall Space Flight Center
Document Type
Other - Patent
Authors
Cheng, Ming
Chen, Weinong
Date Acquired
August 24, 2013
Publication Date
March 20, 2007
Subject Category
Optics
Report/Patent Number
Patent Number: US-Patent-7,193,774
Patent Application Number: US-Patent-Appl-SN-11/001,104
Funding Number(s)
CONTRACT_GRANT: NAG8-1469
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,193,774
Patent Application
US-Patent-Appl-SN-11/001,104
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