Microwave and Millimeter Wave Imaging Using Synthetic Aperture Focusing and Holographical Techniques

Microwave and millimeter wave nondestructive testing and evaluation (NDT&E) methods have shown great potential for determining material composition in composite structures, determining material thickness or debond thickness between two layers, and determining the location and size of flaws, defects, and anomalies. The same testing methods have also shown great potential to produce relatively high-resolution images of voids inside Spray On Foam Insulation (SOFI) test panels using real focused methods employing lens antennas. An alternative to real focusing methods are synthetic focusing methods. The essence of synthetic focusing is to match the phase of the scattered signal to measured points spaced regularly on a plane. Many variations of synthetic focusing methods have already been developed for radars, ultrasonic testing applications, and microwave concealed weapon detection. Two synthetic focusing methods were investigated; namely, a) frequency-domain synthetic aperture focusing technique (FDSAFT), and b) wide-band microwave holography. These methods were applied towards materials whose defects were of low dielectric contrast like air void in SOFI. It is important to note that this investigation used relatively low frequencies from 8.2 GHz to 26.5 GHz that are not conducive for direct imaging of the SOFI. The ultimate goal of this work has been to demonstrate the capability of these methods before they are applied to much higher frequencies such as the millimeter wave frequency spectrum (e.g., 30-300 GHz).