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Application of High-Temperature Extrinsic Fabry-Perot Interferometer Strain SensorIn this presentation to the NASA Aeronautics Sensor Working Group the application of a strain sensor is outlined. The high-temperature extrinsic Fabry-Perot interferometer (EFPI) strain sensor was developed due to a need for robust strain sensors that operate accurately and reliably beyond 1800 F. Specifically, the new strain sensor would provide data for validating finite element models and thermal-structural analyses. Sensor attachment techniques were also developed to improve methods of handling and protecting the fragile sensors during the harsh installation process. It was determined that thermal sprayed attachments are preferable even though cements are simpler to apply as cements are more prone to bond failure and are often corrosive. Previous thermal/mechanical cantilever beam testing of EFPI yielded very little change to 1200 F, with excellent correlation with SG to 550 F. Current combined thermal/mechanical loading for sensitivity testing is accomplished by a furnace/cantilever beam loading system. Dilatometer testing has can also be used in sensor characterization to evaluate bond integrity, evaluate sensitivity and accuracy and to evaluate sensor-to-sensor scatter, repeatability, hysteresis and drift. Future fiber optic testing will examine single-mode silica EFPIs in a combined thermal/mechanical load fixture on C-C and C-SiC substrates, develop a multi-mode Sapphire strain-sensor, test and evaluate high-temperature fiber Bragg Gratings for use as strain and temperature sensors and attach and evaluate a high-temperature heat flux gauge.
Document ID
20080021249
Acquisition Source
Armstrong Flight Research Center
Document Type
Conference Paper
Authors
Piazza, Anthony
(NASA Dryden Flight Research Center Edwards, CA, United States)
Date Acquired
August 24, 2013
Publication Date
May 1, 2008
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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