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Strain and Temperature Sensing Properties of Multiwalled Carbon Nanotube Yarn CompositesStrain and temperature response of Multiwalled Carbon Nanotube (MWCNT/CNT) yarns on a stainless steel test beam has been studied. The carbon nanotube yarns are spun from a multiwalled carbon nanotube forest grown on a silicon substrate to a 4-ply yarn with a diameter of about 15-20 microns. Four of the 4-ply CNT yarns are arranged in a Wheatstone bridge configuration on the stainless steel test beam using a thin layer of polyurethane resin that insulates and protects the yarns from the test beam. Strain sensitivities of the CNT yarn sensors range from 1.39 to 1.75 mV/V/1000 microstrain at room temperature, and temperature sensitivity of the CNT yarn bridge is 91 microA/degC. Resistance of the yarns range from 215 to 270 ohms for CNT yarn length of approximately 5 mm. Processes used in attaching the CNT yarns on the test beam and experimental procedures used for the measurements are described. Conventional metallic foil strain gages are attached to the test beam to compare with the CNT sensors. The study demonstrates multifunctional capability of the sensor for strain and temperature measurements and shows its applicability where engineering strain is less than 3%.
Document ID
20080040160
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Kahng, Seun K.
(NASA Langley Research Center Hampton, VA, United States)
Gates, Thomas S.
(NASA Langley Research Center Hampton, VA, United States)
Jefferson, Gail D.
(National Inst. of Aerospace Hampton, VA, United States)
Date Acquired
August 24, 2013
Publication Date
September 8, 2008
Subject Category
Composite Materials
Meeting Information
Meeting: SAMPE ''08 Fall Technical Conference
Location: Memphis, TN
Country: United States
Start Date: September 8, 2008
End Date: September 11, 2008
Sponsors: Society for the Advancement of Materials and Process Engineering
Funding Number(s)
WBS: WBS 561581.02.08.15.02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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