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Failures in Hybrid Microcircuits During Environmental Testing. History CasesThis purpose of this viewgraph presentation is to discuss failures in hermetic hybrids observed at the GSFC PA Lab during environmental stress testing. The cases discussed are: Case I. Substrate metallization failures during Thermal cycling (TC). Case II. Flex lid-induced failure. Case Ill. Hermeticity failures during TC. Case IV. Die metallization cracking during TC. and how many test cycles and parts is necessary? Case V. Wire Bond failures after life test. Case VI. Failures caused by Au/In IMC growth.
Document ID
20080040687
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Teverovsky, Alexander
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
February 11, 2008
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Components for Military and Space Electronics
Location: San Diego, California
Country: United States
Start Date: February 11, 2008
End Date: February 14, 2008
Sponsors: Components Technology Inst., Inc.
Distribution Limits
Public
Copyright
Public Use Permitted.
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