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Failure Analysis of Electrical Pin ConnectorsA study was initiated to determine the root cause of failure for circuit board electrical connection pins that failed during vibRatory testing. The circuit board is part of an unmanned space probe, and the vibratory testing was performed to ensure component survival of launch loading conditions. The results of this study show that the pins failed as a result of fatigue loading.
Document ID
20080043565
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Newman, John A. (NASA Langley Research Center Hampton, VA, United States)
Baughman, James M. (Lockheed Martin Mission Services Co. Hampton, VA, United States)
Smith, Stephen W. (NASA Langley Research Center Hampton, VA, United States)
Herath, Jeffrey A. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 24, 2013
Publication Date
October 1, 2008
Subject Category
Metals And Metallic Materials
Report/Patent Number
L-19544
NASA/TM-2008-215531
Report Number: L-19544
Report Number: NASA/TM-2008-215531
Funding Number(s)
WBS: WBS 329231.01.07.04.50
Distribution Limits
Public
Copyright
Public Use Permitted.

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