NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Positioning system for single or multi-axis sensitive instrument calibration and calibration system for use therewithA positioning and calibration system are provided for use in calibrating a single or multi axis sensitive instrument, such as an inclinometer. The positioning system includes a positioner that defines six planes of tangential contact. A mounting region within the six planes is adapted to have an inclinometer coupled thereto. The positioning system also includes means for defining first and second flat surfaces that are approximately perpendicular to one another with the first surface adapted to be oriented relative to a local or induced reference field of interest to the instrument being calibrated, such as a gravitational vector. The positioner is positioned such that one of its six planes tangentially rests on the first flat surface and another of its six planes tangentially contacts the second flat surface. A calibration system is formed when the positioning system is used with a data collector and processor.
Document ID
20090004225
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Finley, Tom D.
Parker, Peter A.
Date Acquired
August 24, 2013
Publication Date
December 23, 2008
Subject Category
Mechanical Engineering
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-11/428,017
Patent Number: US-Patent-7,467,536
Patent Number: NASA-Case-LAR-17163-1
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,467,536|NASA-Case-LAR-17163-1
Patent Application
US-Patent-Appl-SN-11/428,017
No Preview Available