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Method for the growth of large low-defect single crystalsA method and the benefits resulting from the product thereof are disclosed for the growth of large, low-defect single-crystals of tetrahedrally-bonded crystal materials. The process utilizes a uniquely designed crystal shape whereby the direction of rapid growth is parallel to a preferred crystal direction. By establishing several regions of growth, a large single crystal that is largely defect-free can be grown at high growth rates. This process is particularly suitable for producing products for wide-bandgap semiconductors, such as SiC, GaN, AlN, and diamond. Large low-defect single crystals of these semiconductors enable greatly enhanced performance and reliability for applications involving high power, high voltage, and/or high temperature operating conditions.
Document ID
20090006100
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Powell, J. Anthony
Neudeck, Philip G.
Trunek, Andrew J.
Spry, David J.
Date Acquired
August 24, 2013
Publication Date
November 11, 2008
Subject Category
Solid-State Physics
Report/Patent Number
Patent Number: US-Patent-7,449,065
Patent Application Number: US-Patent-Appl-SN-11/633,111
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,449,065
Patent Application
US-Patent-Appl-SN-11/633,111
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