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Interferometric Rayleigh Scattering Measurement SystemA method and apparatus for performing simultaneous multi-point measurements of multiple velocity components in a gas flow is described. Pulses of laser light are directed to a measurement region of unseeded gas to produce Rayleigh or Mie scattered light in a plurality of directions. The Rayleigh or Mie scattered light is collected from multiple directions and combined in a single collimated light beam. The Rayleigh or Mie scattered light is then mixed together with a reference laser light before it is passed through a single planar Fabry-Perot interferometer for spectral analysis. At the output of the interferometer, a high-sensitivity CCD camera images the interference fringe pattern. This pattern contains the spectral and spatial information from both the Rayleigh scattered light and the reference laser light. Interferogram processing software extracts and analyzes spectral profiles to determine the velocity components of the gas flow at multiple points in the measurement region. The Rayleigh light rejected by the interferometer is recirculated to increase the accuracy and the applicability of the method for measurements at high temperatures without requiring an increase in the laser energy.
Document ID
20090006537
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Bivolaru, Daniel
Danehy, Paul M.
Lee, Joseph W.
Date Acquired
August 24, 2013
Publication Date
August 19, 2008
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-11/461,569
Patent Number: NASA-Case-LAR-17235-1
Patent Number: US-Patent-7,414,708
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-17235-1|US-Patent-7,414,708
Patent Application
US-Patent-Appl-SN-11/461,569
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