NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Predicting and Measuring System Error Rates for Designs Incorporating Upset Mitigation based on Triple Modular RedundancyThis viewgraph presentation reviews the basics of single event upset mitigation, triple-module redundancy (TMR), new "fitting" equation for TMR, and examples of application to real data.
Document ID
20090007946
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/41085
Authors
Swift, Gary M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Edmonds, Larry D. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 24, 2013
Publication Date
April 10, 2006
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: Single Event Effects (SEE) Symposium
Location: Long Beach, CA
Country: United States
Start Date: April 10, 2006
End Date: April 12, 2006
Distribution Limits
Public
Copyright
Other
Keywords
triple redundant
single event upset (SEU)
triple modular redundancy (TMR)
upset mitigation

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available