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Thermal (Silicon Diode) Data Acquisition SystemsMarshall Space Flight Center s X-ray Cryogenic Facility (XRCF) has been performing cryogenic testing to 20 Kelvin since 1999. Two configurations for acquiring data from silicon diode temperature sensors have been implemented at the facility. The facility's environment is recorded via a data acquisition system capable of reading up to 60 silicon diodes. Test article temperature is recorded by a second data acquisition system capable of reading 150+ silicon diodes. The specifications and architecture of both systems will be presented.
Document ID
20090014728
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Wright, Ernest (NASA Marshall Space Flight Center Huntsville, AL, United States)
Kegley, Jeff (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 24, 2013
Publication Date
October 23, 2008
Subject Category
Instrumentation And Photography
Report/Patent Number
MSFC-2162
Report Number: MSFC-2162
Meeting Information
Meeting: 25th Space Simulation Conference
Location: Annapolis, MD
Country: United States
Start Date: October 29, 2008
End Date: October 23, 2008
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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