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Heavy Ion Testing at the Galactic Cosmic Ray Energy PeakA 1 GeV/u Fe-56 ion beam allows for true 90deg tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the GCR flux energy peak.
Document ID
20090027704
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Pellish, Jonathan A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Xapsos, Michael A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Paul W.
(Marshall (Paul W.) Consultant Brookneal, VA, United States)
Heidel, David F.
(International Business Machines Corp. Yorktown Heights, NY, United States)
Rodbell, Kenneth P.
(International Business Machines Corp. Yorktown Heights, NY, United States)
Hakey, Mark C.
(International Business Machines Corp. Essex Junction, VT, United States)
Dood, Paul E.
(Sandia National Labs. Albuquerque, NM, United States)
Shanneyfelt, Marty R.
(Sandia National Labs. Albuquerque, NM, United States)
Schwank, James R.
(Sandia National Labs. Albuquerque, NM, United States)
Baumann, Robert C.
(Texas Instruments, Inc. Dallas, TX, United States)
Deng, Xiaowei
(Texas Instruments, Inc. Dallas, TX, United States)
Marshall, Andrew
(Texas Instruments, Inc. Dallas, TX, United States)
Sierawski, Brian D.
(Vanderbilt Univ. Nashville, TN, United States)
Black, Jeffrey D.
(Vanderbilt Univ. Nashville, TN, United States)
Reed, Robert A.
(Vanderbilt Univ. Nashville, TN, United States)
Schrimpf, Ronald D.
(Vanderbilt Univ. Nashville, TN, United States)
Kim, Hak S.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Berg, Melanie D.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Campola, Michael J.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Friendlich, Mark R.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Perez, Christopher E.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Phan, Anthony M.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Seidleck, Christina M.
(MEI Technologies, Inc. Greenbelt, MD, United States)
Date Acquired
August 24, 2013
Publication Date
January 1, 2009
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Radiation Effects on Components and Systems (2009 RADECS)
Location: Bruges
Country: Belgium
Start Date: September 14, 2009
End Date: September 18, 2009
Sponsors: Institute of Electrical and Electronics Engineers, Thales Alenia Space
Funding Number(s)
CONTRACT_GRANT: DE-AC04-94Al85000
CONTRACT_GRANT: IACRO 09-45871
CONTRACT_GRANT: IACRO 09-4585I
Distribution Limits
Public
Copyright
Public Use Permitted.
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