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Low-Energy Proton Testing MethodologyUse of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation.
Document ID
20090027717
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Pellish, Jonathan A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Paul W. (NASA Consultant Brookneal, Virginia, United States)
Heidel, David F. (IBM Federal Systems Div. Yorktown Heights, NY, United States)
Schwank, James R. (Sandia Corp. Albuquerque, NM, United States)
Shaneyfelt, Marty R. (Sandia Corp. Albuquerque, NM, United States)
Xapsos, M.A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Raymond L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Berg, Melanie (MEI Technologies, Inc. Seabrook, MD, United States)
Kim, Hak S. (MEI Technologies, Inc. Seabrook, MD, United States)
Phan, Anthony (MEI Technologies, Inc. Seabrook, MD, United States)
Friendlich, M.R. (MEI Technologies, Inc. Seabrook, MD, United States)
Rodbell, Kenneth P. (IBM Federal Systems Div. Yorktown Heights, NY, United States)
Hakey, Mark C. (International Business Machines Corp. Essex Junction, VT, United States)
Dodd, Paul E. (Sandia Corp. Albuquerque, NM, United States)
Reed, Robert A. (Vanderbilt Univ. Nashville, TN, United States)
Weller, Robert A. (Vanderbilt Univ. Nashville, TN, United States)
Mendenhall, Marcus H. (Vanderbilt Univ. Nashville, TN, United States)
Sierawski, B.D. (Vanderbilt Univ. Nashville, TN, United States)
Date Acquired
August 24, 2013
Publication Date
April 20, 2009
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: The 18th Single Event Effects (SEE) Symposium
Location: La Jolla, California
Country: United States
Start Date: April 20, 2009
End Date: April 22, 2009
Sponsors: Defense Threat Reduction Agency, Vanderbilt Univ., Aerospace Corp., NASA Electronic Parts and Packaging Program, Naval Research Lab.
Funding Number(s)
CONTRACT_GRANT: DE-AC04 94AL85000
Distribution Limits
Public
Copyright
Public Use Permitted.

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