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Measuring Multiple Resistances Using Single-Point ExcitationIn a proposed method of determining the resistances of individual DC electrical devices connected in a series or parallel string, no attempt would be made to perform direct measurements on individual devices. Instead, (1) the devices would be instrumented by connecting reactive circuit components in parallel and/or in series with the devices, as appropriate; (2) a pulse or AC voltage excitation would be applied at a single point on the string; and (3) the transient or AC steady-state current response of the string would be measured at that point only. Each reactive component(s) associated with each device would be distinct in order to associate a unique time-dependent response with that device.
Document ID
20090027750
Acquisition Source
Johnson Space Center
Document Type
Other - NASA Tech Brief
Authors
Hall, Dan
(Lockheed Martin Corp. United States)
Davies, Frank
(Hernandez Engineering, Inc. United States)
Date Acquired
August 24, 2013
Publication Date
July 1, 2009
Publication Information
Publication: NASA Tech Briefs, July 2009
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
MSC-23623-1
Distribution Limits
Public
Copyright
Public Use Permitted.
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