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On Nibbles and Bytes: The Conundrum of Memory for Space Systems - NASA Electronic Parts and Packaging (NEPP) and Efforts in MemoriesRadiation requirements and trends. TID: 1) >90% of NASA applications are < 100 krads-Si in piecepart requirements. a) Many commercial devices (NVM and SDRAMs) meet or come close to this. b) Charge pump TID tolerance has improved an order magnitude over the last 10 years. 2) There are always a few programs with higher level needs and, of course, defense needs SEL: 1) Prefer none or rates that are considered low risk. a) Latent damage is a bear to deal with. 2) As we re packing cells tighter and even with lower Vdd, we re seeing SEL on commercial devices regularly (<90nm). a) Often in power conversion, I/O, or control areas. SEU: 1) It s not the bit errors, it s the SEFIs errors that are the biggest issues. a) Scrubbing concerns for risk, power, speed.
Document ID
20090038872
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Pellish, Jonathan
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sheldon, Douglas
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Oldham, Timothy
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Berg, Melanie D.
(MEI Technologies, Inc. United States)
Cohn, Lewis M.
(Naval Research Lab. United States)
Date Acquired
August 24, 2013
Publication Date
October 21, 2009
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Radiation Hardened Electronics Technology (RHET) Meeting
Location: Seattle, WA
Country: United States
Start Date: October 21, 2009
End Date: October 22, 2009
Distribution Limits
Public
Copyright
Public Use Permitted.
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