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600-GHz Electronically Tunable Vector Measurement SystemA compact, high-dynamic-range, electronically tunable vector measurement system that operates in the frequency range from approximately 560 to approximately 635 GHz has been developed as a prototype of vector measurement systems that would be suitable for use in nearly-real-time active submillimeter-wave imaging. As used here, 'vector measurement system" signifies an instrumentation system that applies a radio-frequency (RF) excitation to an object of interest and measures the resulting amplitude and phase response, relative to either the applied excitatory signal or another reference signal related in a known way to applied excitatory signal.
Document ID
20100002231
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other - NASA Tech Brief
Authors
Dengler, Robert
(California Inst. of Tech. Pasadena, CA, United States)
Maiwald, Frank
(California Inst. of Tech. Pasadena, CA, United States)
Siegel, Peter
(California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
June 1, 2007
Publication Information
Publication: NASA Tech Briefs, June 2007
Subject Category
Instrumentation And Photography
Report/Patent Number
NPO-43394
Distribution Limits
Public
Copyright
Public Use Permitted.
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