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Solutions Network Formulation Report. Using NASA Sensors to Perform Crop Type Assessment for Monitoring Insect Resistance in CornThe EPA (U.S. Environmental Protection Agency) is tasked to monitor for insect pest resistance to transgenic crops. Several models have been developed to understand the resistance properties of insects. The Population Genetics Simulator model is used in the EPA PIRDSS (Pest Infestation and Resistance Decision Support System). The EPA Office of Pesticide Programs uses the DSS to help understand the potential for insect pest resistance development and the likelihood that insect pest resistance will negatively affect transgenic corn. Once the DSS identifies areas of concern, crews are deployed to collect insect pest samples, which are tested to identify whether they have developed resistance to the toxins in transgenic corn pesticides. In this candidate solution, VIIRS (Visible/Infrared Imager/Radiometer Suite) vegetation index products will be used to build hypertemporal layerstacks for crop type and phenology assessment. The current phenology attribute is determined by using the current time of year to index the expected growth stage of the crop. VIIRS might provide more accurate crop type assessment and also might give a better estimate on the crop growth stage.
Document ID
20100003150
Acquisition Source
Stennis Space Center
Document Type
Other - Other
Authors
Lewis, David
(Institute for Technology Development Bay Saint Louis, MS, United States)
Copenhaver, Ken
(Institute for Technology Development Bay Saint Louis, MS, United States)
Anderson, Daniel
(Institute for Technology Development Bay Saint Louis, MS, United States)
Hilbert, Kent
(Institute for Technology Development Bay Saint Louis, MS, United States)
Date Acquired
August 25, 2013
Publication Date
June 1, 2007
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
SSTI-2220-0151
Report Number: SSTI-2220-0151
Funding Number(s)
CONTRACT_GRANT: NNS04AB54T
Distribution Limits
Public
Copyright
Public Use Permitted.
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