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A Model-Based Probabilistic Inversion Framework for Wire Fault Detection Using TDRTime-domain reflectometry (TDR) is one of the standard methods for diagnosing faults in electrical wiring and interconnect systems, with a long-standing history focused mainly on hardware development of both high-fidelity systems for laboratory use and portable hand-held devices for field deployment. While these devices can easily assess distance to hard faults such as sustained opens or shorts, their ability to assess subtle but important degradation such as chafing remains an open question. This paper presents a unified framework for TDR-based chafing fault detection in lossy coaxial cables by combining an S-parameter based forward modeling approach with a probabilistic (Bayesian) inference algorithm. Results are presented for the estimation of nominal and faulty cable parameters from laboratory data.
Document ID
20100027330
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Schuet, Stefan R.
(NASA Ames Research Center Moffett Field, CA, United States)
Timucin, Dogan A.
(NASA Ames Research Center Moffett Field, CA, United States)
Wheeler, Kevin R.
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 24, 2013
Publication Date
May 3, 2010
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
ARC-E-DAA-TN955
ARC-E-DAA-TN1389
Report Number: ARC-E-DAA-TN955
Report Number: ARC-E-DAA-TN1389
Meeting Information
Meeting: 2010 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2010
Location: Austin, TX
Country: United States
Start Date: May 3, 2010
End Date: May 6, 2010
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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