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Optimizing X-Ray Optical Prescriptions for Wide-Field ApplicationsX-ray telescopes with spatial resolution optimized over the field of view (FOV) are of special interest for missions, such as WFXT, focused on moderately deep and deep surveys of the x-ray sky, and for solar x-ray observations. Here we report on the present status of an on-going study of the properties of Wolter I and polynominal grazing incidence designs with a view to gain a deeper insight into their properties and simply the design process. With these goals in mind, we present some results in the complementary topics of (1) properties of Wolter I x-ray optics and polynominal x-ray optic ray tracing. Of crucial importance for the design of wide-field x-ray optics is the optimization criteria. Here we have adopted the minimization of a merit function, M, which measures the spatial resolution averaged over the FOV: M= ((integral of d phi) between the limits of 0 and 2 pi) (integral of d theta theta w(theta) sigma square (theta,phi) between the limits of 0 and theta(sub FOV)) (integral of d phi between the limits of 0 and phi/4) (Integral of d theta theta w(theta) between the limits of 0 and theta(sub FOV) where w(theta(sub 1) is a weighting function and Merit function: sigma-square (theta, phi) = summation of (x,y,z) [-<(x,y,z)> (exp 2)] is the spatial variance for a point source on the sky at polar and azimuthal off-axis angles (theta,phi).
Document ID
20100033128
Acquisition Source
Marshall Space Flight Center
Document Type
Presentation
Authors
Elsner, R. F.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
O'Dell, S. L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Ramsey, B. D.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Weisskopf, M. C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 25, 2013
Publication Date
June 27, 2010
Subject Category
Astronomy
Report/Patent Number
M10-1026
M10-0840
Report Number: M10-1026
Report Number: M10-0840
Meeting Information
Meeting: SPIE Conference
Location: San Diego, CA
Country: United States
Start Date: June 27, 2010
End Date: July 3, 2010
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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