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Monolithically Integrated, Mechanically Resilient Carbon-Based Probes for Scanning Probe MicroscopyScanning probe microscopy (SPM) is an important tool for performing measurements at the nanoscale in imaging bacteria or proteins in biology, as well as in the electronics industry. An essential element of SPM is a sharp, stable tip that possesses a small radius of curvature to enhance spatial resolution. Existing techniques for forming such tips are not ideal. High-aspect-ratio, monolithically integrated, as-grown carbon nanofibers (CNFs) have been formed that show promise for SPM applications by overcoming the limitations present in wet chemical and separate substrate etching processes.
Document ID
20100039415
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other - NASA Tech Brief
Authors
Kaul, Anupama B.
(California Inst. of Tech. Pasadena, CA, United States)
Megerian, Krikor G.
(California Inst. of Tech. Pasadena, CA, United States)
Jennings, Andrew T.
(California Inst. of Tech. Pasadena, CA, United States)
Greer, Julia R.
(California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
November 1, 2010
Publication Information
Publication: NASA Tech Briefs, November 2010
Subject Category
Instrumentation And Photography
Report/Patent Number
NPO-47185
Distribution Limits
Public
Copyright
Public Use Permitted.
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