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Portable Handheld Optical Window Inspection DeviceThe Portable Handheld Optical Window Inspection Device (PHOWID) is a measurement system for imaging small defects (scratches, pits, micrometeor impacts, and the like) in the field. Designed primarily for window inspection, PHOWID attaches to a smooth surface with suction cups, and raster scans a small area with an optical pen in order to provide a three-dimensional image of the defect. PHOWID consists of a graphical user interface, motor control subsystem, scanning head, and interface electronics, as well as an integrated camera and user display that allows a user to locate minute defects before scanning. Noise levels are on the order of 60 in. (1.5 m). PHOWID allows field measurement of defects that are usually done in the lab. It is small, light, and attaches directly to the test article in any orientation up to vertical. An operator can scan a defect and get useful engineering data in a matter of minutes. There is no need to make a mold impression for later lab analysis.
Document ID
20100039427
Acquisition Source
Kennedy Space Center
Document Type
Other - NASA Tech Brief
Authors
Ihlefeld, Curtis
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Dokos, Adam
(NASA Kennedy Space Center Cocoa Beach, FL, United States)
Burns, Bradley
(ASRC Aerospace Corp. Cocoa Beach, FL, United States)
Date Acquired
August 25, 2013
Publication Date
November 1, 2010
Publication Information
Publication: NASA Tech Briefs, November 2010
Subject Category
Instrumentation And Photography
Report/Patent Number
KSC-13218
Distribution Limits
Public
Copyright
Public Use Permitted.
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