Determining the Differential Emission Measure from EIS, XRT, and AIA

This viewgraph presentation determines the Differential Emission Measure (DEM) from the EUV Imaging Spectrometer (EIS), X Ray Telescope (XRT), and Atmospheric Imaging Array (AIA). Common observations with Fe, Si, and Ca EIS lines are shown along with observations with Al-mesh, Ti-poly Al-thick and Be-thick XRT filters. Results from these observations are shown to determine what lines and filters are important to better constrain the hot component.