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Development and Application of Wide Bandwidth Magneto-Resistive Sensor Based Eddy Current ProbeThe integration of magneto-resistive sensors into eddy current probes can significantly expand the capabilities of conventional eddy current nondestructive evaluation techniques. The room temperature solid-state sensors have typical bandwidths in the megahertz range and resolutions of tens of microgauss. The low frequency sensitivity of magneto-resistive sensors has been capitalized upon in previous research to fabricate very low frequency eddy current sensors for deep flaw detection in multilayer conductors. In this work a modified probe design is presented to expand the capabilities of the device. The new probe design incorporates a dual induction source enabling operation from low frequency deep flaw detection to high frequency high resolution near surface material characterization. Applications of the probe for the detection of localized near surface conductivity anomalies are presented. Finite element modeling of the probe is shown to be in good agreement with experimental measurements.
Document ID
20100042300
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Wincheski, Russell A.
(NASA Langley Research Center Hampton, VA, United States)
Simpson, John
(Lockheed Martin Space Operations Hampton, VA, United States)
Date Acquired
August 25, 2013
Publication Date
July 18, 2010
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NF1676L-10687
Report Number: NF1676L-10687
Meeting Information
Meeting: 37th Annual Review of Progress in QNDE
Location: San Diego, CA
Country: United States
Start Date: July 18, 2010
End Date: July 23, 2010
Funding Number(s)
WBS: WBS 698259.02.07.07.02
Distribution Limits
Public
Copyright
Public Use Permitted.
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