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Material condition assessment with eddy current sensorsEddy current sensors and sensor arrays are used for process quality and material condition assessment of conducting materials. In an embodiment, changes in spatially registered high resolution images taken before and after cold work processing reflect the quality of the process, such as intensity and coverage. These images also permit the suppression or removal of local outlier variations. Anisotropy in a material property, such as magnetic permeability or electrical conductivity, can be intentionally introduced and used to assess material condition resulting from an operation, such as a cold work or heat treatment. The anisotropy is determined by sensors that provide directional property measurements. The sensor directionality arises from constructs that use a linear conducting drive segment to impose the magnetic field in a test material. Maintaining the orientation of this drive segment, and associated sense elements, relative to a material edge provides enhanced sensitivity for crack detection at edges.
Document ID
20110000802
Acquisition Source
Johnson Space Center
Document Type
Other - Patent
Authors
Goldfine, Neil J.
Washabaugh, Andrew P.
Sheiretov, Yanko K.
Schlicker, Darrell E.
Lyons, Robert J.
Windoloski, Mark D.
Craven, Christopher A.
Tsukernik, Vladimir B.
Grundy, David C.
Date Acquired
August 25, 2013
Publication Date
October 12, 2010
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
Patent Application Number: US-Patent-Appl-SN-12/484,761
Patent Number: US-Patent-7,812,601
Funding Number(s)
CONTRACT_GRANT: NAS9-20000
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,812,601
Patent Application
US-Patent-Appl-SN-12/484,761
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