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Detecting strain in birefringent materials using spectral polarimetryA method, computer program product and system for analyzing multispectral images from a plurality of regions of birefringent material, such as a polymer film, using polarized light and a corresponding polar analyzer to identify differential strain in the birefringent material. For example, the birefringement material may be low-density polyethylene (LDPE), high-density polyethylene (HDPE), polypropylene, polyethylene terephthalate (PET), polyvinyl chloride (PVC), polyvinylidene chloride, polyester, nylon, or cellophane film. Optionally, the method includes generating a real-time quantitative strain map.
Document ID
20110000836
Acquisition Source
Goddard Space Flight Center
Document Type
Other - Patent
Authors
Ragucci, Anthony J.
Cisar, Alan J.
Huebschman, Michael L.
Garner, Harold R.
Date Acquired
August 25, 2013
Publication Date
December 28, 2010
Subject Category
Optics
Report/Patent Number
Patent Number: US-Patent-7,859,653
Patent Application Number: US-Patent-Appl-SN-11/848,284
Funding Number(s)
CONTRACT_GRANT: NNG06LA05C
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-7,859,653
Patent Application
US-Patent-Appl-SN-11/848,284
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